• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    TESTING EQUIPMENT, TESTING SYSTEM AND PROCESS FOR TESTING AN ENERGY TECHNICAL TESTING OBJECT. For testing a test object (14) of energy technique, a test signal is generated by a first tester (2), which is fed by the first tester (2) to a second tester (3), to be amplified by it and sent to the test object (14) of energy technique. In addition, the test signal can be applied by the first test device (2) to the test object (14) of energy technique, and the test signal is emitted by the first test device (2) and the second test device test (3), preferably in time synchronized to the test object (14) of energy technique.
    公开号:BR102013011576B1
    申请号:R102013011576-2
    申请日:2013-05-09
    公开日:2020-10-20
    发明作者:Ulrich Klapper
    申请人:Omicron Electronics Gmbh；
    IPC主号:
    专利说明:

    [0001] The invention relates to a test apparatus, a test system and a process for testing an energy technique test object. In particular, the invention relates to a test apparatus, a test system and a process for testing or verifying means of production in high and medium voltage electrical systems, such as, for example, power transformers, current transformers / voltage switches, power switches, generators, motors or cable systems, protection relays, etc.
    [0002] Modern test devices for means of production in high and medium voltage electrical systems usually have a processor or a controller, which calculates for a test signal a desired signal shape, for example, a sinusoidal signal shape changeable, it features a digital / analog transformer for converting the signal form generated with it into an analog test signal, as well as an amplifier for amplifying the test signal, to thereby obtain the test signal with a desired amplitude.
    [0003] Depending on the selection of components used in the respective tester, however, the range of amplitude to be achieved in each case is limited. For certain applications, therefore, in external test environments, separate external amplifiers are used, which are requested with the respective test signal and output the test signal amplified in this way to the respective test object. These separate amplifiers, whose function is limited to the amplification functionality, however, increase the costs associated with the test system or the test environment.
    [0004] The present invention, therefore, is based on the task of making available a possibility to increase with simple means the area of use of a test environment and to be able to test an energy technique test object with a wider scope .
    [0005] This task is solved by a test apparatus, a test system and a test process in accordance with the present invention. The embodiments define advantageous or preferred embodiments of the invention.
    [0006] According to the invention, a test device is used, which is configured to test an energy technique test object, particularly a medium or high voltage system operating means, for amplifying a signal of test from another tester. The amplifier of the tester, however provided for in the signal path that serves to generate its own test signal, is therefore used as an additional amplifier for the test signal of the other tester. The test signal is decoupled from the corresponding signal path of the other tester at an appropriate point and fed to the signal path of the tester, which serves as an additional amplifier.
    [0007] The two testers can have an extensively similar structure, as previously described. It is only necessary that the tester, which serves as an additional amplifier, has an input for supplying the test signal to the other tester, while the other tester has a separate output for decoupling or emitting the corresponding test signal. Preferably, the two testers are formed in an identical way, in each case the input to the tester, which generates the effective test signal, and the additional output to the tester, which serves as an additional amplifier , remain unused.
    [0008] The tester, to which the test signal of the other tester can be fed, can therefore be operated, optionally, as a conventional tester, to generate its own test signal or in a " amplifier mode "as an amplifier for the test signal from the other tester.
    [0009] When the tester is used as an amplifier, the amplified test signal of the other tester can be applied by that tester to the test object, instead of the test signal normally generated by the tester, being that the test response of the test object can be assessed by one or also by two test devices. In total, therefore, the amplitude or power range, which is available to test the test object, can be clearly expanded with simple means, compared to conventional test devices, and in general, by the procedure described can a doubling of the power range can be obtained. For this purpose, the other tester is used, however existing in the respective test environment. A separate and expensive amplifier is not necessary.
    [00010] The test device operated in "amplifier mode" can be fed the test signal from the other test device to be amplified, test device from an analog or digital interface, for example, USB, Ehternet, Ethercat, IEC 61850. Advantageously, the transmission of the test signal takes place by means of a digital interface tester, since, in this case, it can be carried out on the tester, with relatively simple measures, to compensate for the application time of the digital data , to ensure a time-synchronized transmission by the two testers of sample values of the test signal to the test object. Due to the application time of the test signal of the interface test device in each case used, between the test signal originally generated and the test signal amplified by the test device operated in the "amplifier mode", undesirable phase shifts may occur, that in a test signal with a frequency in the order of size of 50 Hz can make some degrees. When the application time of the test signal from the interface tester is compensated, a theoretically desirable phase accuracy can be obtained.
    [00011] The application time compensation can be carried out, for example, for a user, by adjusting a correction value on the test device operated in "amplifier mode".
    [00012] As, however, the application time, in general, is not constant and consequently, it is also not known, it is advantageous when using a digital interface, the sample values of the test signal to be amplified are endowed and transmitted with time information in the form of a time stamp, so that the tester, which acts as an amplifier, can output the individual sample values at the times, in each case, exactly right. For this purpose, the tester may have an integrated real-time clock.
    [00013] Alternatively or additionally, according to another example of the modality of the invention, the application time is compensated by using a process described in the IEEE 1588 standard. The application time compensation can also be simplified by using a digital Ethercat interface, since this interface generates time that is temporally synchronized with the transmitter, and that can be used to synchronize the individual digital sample values of the test signal to be amplified with that time.
    [00014] The invention is described in the following by means of preferred examples of embodiment, with reference to the drawing.
    [00015] Fig. 1 shows a schematic diagram of a test system for testing an energy technique test object according to an example of the invention.
    [00016] Fig. 2 shows a schematic diagram of a test system for testing an energy technique test object according to another example of the modality of the invention.
    [00017] Figure 1 shows a schematic diagram of a test system 1. Test system 1 comprises a first test device 2 and a second test device 3. In the case of the two test devices 2, 3 is , in each case of a tester to test means of production in electrical systems of low or medium voltage, such as, for example, power transformers, current / voltage transformers, power switches, generators, motors or cable systems , protection relays, etc.
    [00018] The structure of the two testers 2, 3 is similar in that the two testers feature a test signal generating device 4 or 9, in connection with a digital / analog transformer 5 or 10 and an amplifier 6 or 11. The test signal generating devices 4, 9 can comprise a microprocessor or a controller, which calculates for the test signal in each desired case the appropriate signal form, for example, in the form of an alterable sinusoidal signal, which is converted by the digital / analog transformer, in each case, arranged downstream, into a corresponding analog test signal. Amplifier 6 or 11 amplifies the corresponding analog test signal and outputs it via an output of the respective tester.
    [00019] Each of the two testers 2, 3 can thus generate a test signal to test a test object 14 represented schematically in Fig. 1, the response of test object 14 can be detected by an evaluation device 8 or 13 and evaluated appropriately.
    [00020] In the modality example shown in Fig.1, however, the second tester 3 is not operated as a "normal" tester, similarly to tester 2, but the second tester 3 it is so coupled with the tester 2 that it works in an "amplifier" mode as an amplifier for the test signal generated by the first tester 2.
    [00021] For this purpose, the first tester 2 has a separate output 7, to decouple the test signal at an appropriate point in the signal path of the tester4 2 while the second tester 3 has a separate input 12 , to feed the test signal received from the first tester 2 to the signal path with amplifier 11. In the example of the modality shown in Fig. 1, the decoupling of the test signal in the first tester 2 occurs between the device test signal generation 4 and digital / analog transformer 5, so that the test signal is fed, corresponding to the signal path of the second tester 3, between the test signal generation device 9 (inactive in "amplifier" mode) and digital / analog transformer 10.
    [00022] The test signal from the first tester 2, thus fed to the second tester 3, is therefore converted by digital / analog transformer 0 of the second tester 3 into a corresponding analog signal and amplified by the amplifier 11, so that it can be sent with the desired amplitude to the test object 14.
    [00023] The two test devices 2, 3 therefore apply the same test signal to the test object, with the second test device 3 acting only as an amplifier for the test signal generated by the first test device 2 The response to the test signal of the test object 14 can, in principle, be evaluated by the two test devices, however, according to Fig.1, it must be assumed that the evaluation of the The test signal response of the test object 14 occurs by the evaluation device 8 of the first tester.
    [00024] To the second tester 3, operated in "amplifier mode", the test signal to be amplified is fed by tester 2 via connections 7 and 12 via an analog or digital interface, for example, a USB interface, an Ehternet interface, an Ethercat interface, or an interface according to the IEC 61850 standard. Advantageously, the transmission of the test signal from the test device to a digital interface, since in this case it can compensation of the time of application of the digital data can be carried out with relatively simple measures, to ensure a time-synchronized emission by the two test devices 2, 3 of sample values of the test signal to the test object 14.
    [00025] Due to the time of application of the test signal through the interface in each executed case, with connections 7 and 12, between the test signal of the first test device 2 originally generated and the test signal amplified by the second test device test 3 operated in "intensifier mode", undesirable phase shifts may occur. When the application time of the test signal is compensated via the interface, a theoretically desirable phase accuracy can be obtained between the test signal of the first tester 2 and the amplified version of that test signal generated by the second tester 3 .
    [00026] For this purpose, the second tester 3 is equipped with an application time compensation device, which in the example shown in Fig. 1 is arranged upstream of the digital / analog transformer 10, to carry out a compensation application time. Alternatively, an analog application time compensation is also conceivable, that is, between a digital / analog transformer 10 and the amplifier 11.
    [00027] The application time compensation can be carried out, for example, by a user by adjusting a correction value on the second tester 3, operated in the "amplifier mode", the time compensation device being Application 15 may comprise a corresponding adjustment member, for example, a digital potentiometer, to adjust the correction value in each desired case for the compensation of the application time. The correction value can also be applied to the test signal using software. The test signal requested with the time correction value is finally sent by amplifier 11 to the test object.
    [00028] However, as the application time, in general, is not constant and, consequently, it is also not known, it is advantageous when using a digital interface of the first test device 2, the sample values of the test signal a amplified in the second tester 3 are provided and are transmitted with time information, in the form of a time stamp, so that the second tester 3, which functions as an amplifier, can output the individual sample values in the moments, in each case exactly correct. To that end, the application time compensation device 15 of the second tester 3 can have an integrated real-time clock, so that the second tester 3 can output the sample values of the test signal, with respect to to that real-time clock, at the right times, in each case, to the test object 14.
    [00029] The correction of the application time can also occur through the use of a process described in the IEEE 1588 standard.
    [00030] According to another variant, the correction of the application time can be simplified by the use of an Ethercat interface, between test devices 2 and 3, since this interface generates a time-synchronized time on the receiver. with the transmitter that can be used by the application time compensation device 15 to synchronize with that time on the second tester 3 the individual digital sample values of the test signal to be amplified.
    [00031] In Fig. 2 another example of a test system according to the invention is shown.
    [00032] The modality example shown in Fig. 2 differs from the modality example shown in Fig. 1 only in that the decoupling of the test signal occurs through output 7 on the first tester 2, between the digital / analog transformer 5 and amplifier 6 and the decoupled test signal are consequently fed to the signal path of the second tester 3 via input 12 between digital / analog transformer 10 and amplifier 11.
    [00033] In the analog decoupling shown in Fig. 2 of the test signal via output 7 of tester 2, which is connected to the output of the digital / analog transformer of tester 2, the application time compensation device 15 shown in Fig. 1 can be suppressed, since, in this case, it is possible, eventually, to start from a marginal phase shift in the two testers 2, 3 and the phase shift, moreover, must be of the same size in amplifiers 6, 11 of the two testers 2, 3. But, alternatively, also the example of modality shown in Fig. 2 can be complemented with an application time compensation, similarly 4 to the example of modality shown in Fig. 1.
    [00034] Furthermore, with reference to Fig. 2, reference can be made in full to the above modalities for Figure 1.
    权利要求:
    Claims (18)
    [0001]
    1. Test apparatus (2) for testing a test object (14) of energy technique, which comprises a signal path with means for generating test signals (4) for generating a test signal and with amplifying means (6) to amplify the test signal, to output the amplified test signal through an output for testing the test object (14) of energy technique, and an additional output (7) for decoupling the test signal from the signals and emission of the test signal to another test device (3), characterized by the fact that the test device (2) is configured in such a way that it emits sample values of the test signal through the output (7) additional, along with time information corresponding to the other tester (3) to control the temporal emission of these sample values by the other tester (3).
    [0002]
    2. Test apparatus (2) according to claim 1, characterized in that the signal path of the test apparatus (2) has means of digital / analog transformation (5) between the means of generating test signals (4) and the amplification means (6), the test signal being decoupled through the additional output (7) between the test signal generation means (4) and the digital / analog transformation means (5) .
    [0003]
    Test apparatus (2) according to claim 1, characterized in that the signal path of the test apparatus (2) has means of digital / analog transformation (5) between the means of generating test signals (4) and the amplification means (6), the test signal being decoupled through the additional output (7) between the digital / analog transformation means (5) and the amplification means (6).
    [0004]
    Test apparatus (2) according to any one of claims 1 to 3, characterized in that the additional output (7) comprises a digital interface for decoupling the test signal from the other test apparatus (3).
    [0005]
    5. Test apparatus (3) for testing a test object (14) of energy technique, which comprises a signal path with means for generating test signals (9) for generating a test signal and with amplifying means (11) to amplify the test signal, to output the amplified test signal through an output for testing the test object (14) of energy technique, and an input (12) for supplying a test signal decoupled from a another test device (2) to the signal path and emission of that test signal amplified by the means of amplification (11) of the signal path through the output to test the test object (14) of energy technique, characterized by the fact that the tester (3) has means of compensation (15) for compensating for a time of application of the test signal decoupled from the other tester (2), to send that test signal to the test object (14) time-synchronized with the signal of test also sent to the test object (14) of energy technique by the other tester (2).
    [0006]
    Test apparatus (3) according to claim 5, characterized in that the signal path of the test apparatus (3) has means of digital / analog transformation (10) between the means of generating test signals (9) and the amplification means (11), the test signal being fed through the input (12) between the test signal generation means (9) and the digital / analog transformation means (10).
    [0007]
    7. Test apparatus (3) according to claim 5, characterized in that the signal path of the test apparatus (3) has means of digital / analog transformation (10) between the means of generating test signals (9) and the amplification means (11), the test signal being fed through the input (12) between the digital / analog transformation means (10) and the amplification means (11).
    [0008]
    Test apparatus (3) according to any one of claims 5 to 7, characterized in that the compensation means (15) are configured in such a way that they compensate the application time of the test signal with a value adjustable correction.
    [0009]
    Test apparatus (3) according to any one of claims 5 to 7, characterized in that the compensation means (15) are configured in such a way that they induce the emission of sample values from the decoupled test signal from the other tester (2) and fed to the signal path to the test object (14) of energy technique at times that, together with the test signal, correspond to the time information transmitted by the other tester (2).
    [0010]
    Test apparatus (3) according to any one of claims 5 to 7, characterized in that the compensation means (15) are configured in such a way that they compensate the application time by using a process according to the IEEE 1588 standard or by emission to the test object (14) of energetic technique of sample values of the test signal decoupled from the other test device (2) and fed to the signal path in a time-synchronized manner with a time an interface, through which the test signal is transmitted by the other tester (2) to the tester (3).
    [0011]
    Test apparatus (3) according to any one of claims 5 to 10, characterized in that the input (12) comprises a digital interface for supplying the test signal from the other test apparatus (2) to the test path. signals.
    [0012]
    12. Test apparatus (2, 3) according to claim 4 or 11, characterized by the fact that the digital interface is an Ethernet interface, a USB interface, an Ethercat interface or an interface according to the standard IEC61850.
    [0013]
    13. Test apparatus (2, 3) according to any one of the preceding claims, characterized in that the test apparatus (2, 3) is configured to test a means of operation of a high or medium voltage electrical system .
    [0014]
    14. Test system (1) to test a test object (14) of energy technique, characterized by the fact that it comprises a first test device (2) to test the test object (14) of energy technique, being that the first tester (2) has a signal path (4-6) for generating a test signal, amplifying the test signal and emitting the amplified test signal via an output to test the test object (14 ) of energetic technique, and the first tester (2) has an additional output (7) for decoupling the test signal from the signal path (4-6) of the first tester (2), The tester (2) is configured in such a way that it emits sample values of the test signal via the additional output (7), along with time information corresponding to a second tester (3) for controlling the temporal emission of these sample values by the second tester (3), and the second apparatus test tool (3) to test the test object (14) of energy technique, the second test device (3) having a signal path (9-11) for generating a test signal, amplifying the signal test and emission of the amplified test signal through an output to test the test object (14) of energy technique, and the second tester has an input (12) for supplying the test signal of the first tester test (2), decoupled via the additional output (7) of the first tester (2), to the signal path (9-11) of the second tester (3), to amplify the test signal of the first tester test (2) and emit it through the output of the second tester (3) to test the test object (14) of energy technique, and the second tester (3) has means of compensation (15) for compensation of an application time of the test signal decoupled from the first tester (2), for sending this test signal to the test object (14) of energy technique in a time synchronized way with the test signal also emitted to the test object (14) of energy technique by the first test device (2).
    [0015]
    Test system (1) according to claim 14, characterized in that the first test device (2) is a test device, as defined in any one of claims 1 to 4 or 11 to 13, provided that these claims are dependent on claims 1 to 4, and the second tester (3) being a tester, as defined in any of claims 5 to 10 or 11 to 13, provided that those claims are dependent on claims 5 to 10.
    [0016]
    16. Process for testing a test object (14) of energy technique, which comprises generating a test signal with the aid of a first test device (2), which is configured to test the test object (14) of technique energetic, decoupling the test signal from a signal path (4-6) of the first tester (2), supplying the test signal decoupled from the first tester (2) to a signal path (9-11) a second tester (3), which is configured to test the test object (14) of energy technique, expansion of the test signal fed into the signal path (9-11) of the second tester (3), and emission of the amplified test signal through an output of the second test device (3) to test the test object (14) of energy technique, characterized by the fact that the test signal is emitted by the second test device (3 ) in a time-synchronized manner with the test signal emitted by the first test (2).
    [0017]
    17. Process according to claim 16, characterized in that the test signal is amplified in the signal path (4-6) of the first tester (2) and output through an output of the first tester ( 2) to test the test object (14) of energy technique.
    [0018]
    18. Process according to claim 16 or 17, characterized in that the first test apparatus (2) is a test apparatus, as defined in any one of claims 1 to 4 or 11 to 13, provided that those claims are dependent on claims 1 to 4, and the second tester (3) is a tester as defined in any of claims 5 to 10 or 11 to 13, provided that those claims are dependent on claims 5 to 10.
    类似技术:
    公开号 | 公开日 | 专利标题
    BR102013011576B1|2020-10-20|test apparatus, test system and process for testing an energy technique test object
    JP6349602B2|2018-07-04|Inverter and solar power generation system
    JP2011128029A|2011-06-30|Optional waveform generator
    WO2014125348A3|2014-11-27|Methods for anti-islanding in distributed-source electrical power generation and distribution systems and electrical systems and apparatus using same
    ES2441869T3|2014-02-06|Sensor device for generating signals that are indicative of position or limb position change
    JP2016505230A5|2017-02-23|
    JP2015118088A|2015-06-25|Accessory and calibration method thereof
    KR20070013314A|2007-01-30|Direct current test apparatus
    JP2015036647A5|2016-08-12|
    TW200721165A|2007-06-01|Apparatus for generating reference voltage in semiconductor memory apparatus
    KR101424955B1|2014-08-01|Power Sensor, Sensor Power Volume Expansion Unit and Electrical Power Measurement System
    JP2009180644A|2009-08-13|Measurement instrument
    JP2009100242A|2009-05-07|Automatic adjustment system for digital controller
    CN104539245A|2015-04-22|Self-zeroing circuit of operational amplifier
    JP2010175413A|2010-08-12|Measuring system
    JP5930894B2|2016-06-08|Power system analysis device and analysis method
    CN202285032U|2012-06-27|Electronic transformer harmonic influence testing device
    CN105954702A|2016-09-21|Electronic transformer calibrator phase error detection system and method
    JP2010066069A|2010-03-25|Secondary surveillance radar system
    Grzegrzółka et al.2017|Concept of Cavity Simulator for European Spallation Source
    JP6204046B2|2017-09-27|Simulator, simulation system, simulation method, and program
    JP2008215898A|2008-09-18|Impedance measurement apparatus
    CN215378939U|2021-12-31|Wearable equipment
    CN104122422A|2014-10-29|Constant current power supply generation circuit
    Barrientos et al.2018|Commissioning and performance of a phase-compensated optical link for the AWAKE experiment at CERN
    同族专利:
    公开号 | 公开日
    US9366711B2|2016-06-14|
    US20130307558A1|2013-11-21|
    KR101438670B1|2014-09-05|
    CA2813824A1|2013-11-15|
    AU2013205403B2|2015-02-12|
    KR20130127930A|2013-11-25|
    CN103323693B|2017-03-01|
    CA2813824C|2017-02-21|
    SA113340527B1|2015-12-31|
    EP2664933B1|2014-06-25|
    ES2485377T3|2014-08-13|
    CN103323693A|2013-09-25|
    EP2664933A1|2013-11-20|
    BR102013011576A2|2015-06-30|
    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    GB836805A|1955-06-27|1960-06-09|Gen Electric|Improved circuit arrangement for detecting faults in three-phase systems|
    GB8620658D0|1986-08-26|1986-10-01|Era Patents Ltd|Testing electrical equipment|
    US5083094A|1990-09-28|1992-01-21|Space Systems/Loral, Inc.|Selective power combiner using phase shifters|
    JPH05288775A|1992-02-13|1993-11-02|Nissin Electric Co Ltd|Protecting apparatus for alternating current input part and alternating current input system|
    JP2000083321A|1998-07-01|2000-03-21|Kawaguchi Denki Seisakusho:Kk|Line termination protector|
    US6942771B1|1999-04-21|2005-09-13|Clinical Micro Sensors, Inc.|Microfluidic systems in the electrochemical detection of target analytes|
    US6693436B1|1999-12-23|2004-02-17|Intel Corporation|Method and apparatus for testing an integrated circuit having an output-to-output relative signal|
    US6445196B1|2000-09-25|2002-09-03|Xenia Burdette White|Transformer test control device|
    US6504381B1|2000-10-02|2003-01-07|Chroma Ate Inc.|Two-output voltage test system|
    DE10125382A1|2001-01-26|2002-08-14|Cst Concepts Comm System Test|Distributed test system for testing and monitoring electronic signals at network connections processing signals taking into account associated time information|
    US6795789B2|2001-05-21|2004-09-21|Omnicron Electronics Corp. Usa|System for testing of intelligent electronic devices with digital communications|
    US6662124B2|2002-04-17|2003-12-09|Schweitzer Engineering Laboratories, Inc.|Protective relay with synchronized phasor measurement capability for use in electric power systems|
    JP4543370B2|2004-03-16|2010-09-15|ネッツエスアイ東洋株式会社|Power line frequency characteristic measurement device|
    KR100780941B1|2005-08-24|2007-12-03|삼성전자주식회사|High speed test data generator capable of inserting noise and automatic test system using the same|
    KR100856563B1|2007-03-14|2008-09-04|주식회사 캄코|Gear unit of vertical adjustment motor of seat for vehicles|
    CN101290345B|2008-06-06|2010-10-13|北京浩霆光电技术有限责任公司|Multifunctional mutual-inductor tester|
    EP2329333A4|2008-08-21|2014-12-03|Chronologic Pty Ltd|Synchronisation and timing method and apparatus|
    EP2163911B1|2008-09-16|2011-01-26|Omicron electronics GmbH|Method for testing a protective device and correspondingly equipped protective device and testing device|
    DE102010007349B4|2009-02-09|2018-03-01|Fuji Electric Co., Ltd.|Anomaly monitoring device|
    CN102098205B|2009-12-10|2014-12-31|中兴通讯股份有限公司|Clock synchronization method and system for broadband power line node|
    CN101795020B|2010-02-08|2012-05-02|百利四方智能电网科技有限公司|Automatic time-tick synchronization system of intelligent electronic equipment of transformer substation|
    CN201681152U|2010-05-05|2010-12-22|武汉大学|Electronic type general mutual inductor check meter|CN104575195B|2013-10-18|2017-03-22|上海工程技术大学|TwinCAT-based triaxial control experimental device|
    KR101552119B1|2013-11-21|2015-09-11|건국대학교 산학협력단|OPTIMAL PHASING OF NODES SEARCH SYSTEM FOR EtherCAT|
    WO2016124698A1|2015-02-06|2016-08-11|Omicron Electronics Gmbh|Transformer test device and method for testing a three-winding transformer|
    AT517437B1|2015-06-17|2018-06-15|Omicron Electronics Gmbh|Test apparatus and method for operating a test apparatus|
    AT517906B1|2015-11-10|2018-10-15|Omicron Electronics Gmbh|Battery operated relay tester|
    CN105911468A|2016-04-28|2016-08-31|北京中水科水电科技开发有限公司|Uniform accessing apparatus for onsite test parameters for waterpower set|
    KR101906383B1|2017-03-10|2018-10-11|한국전력공사|Apparatus and method for managing test of protective relay|
    CN109426240B|2017-09-05|2020-10-27|大唐联仪科技有限公司|Test method and device|
    US11108737B2|2019-07-12|2021-08-31|Schweitzer Engineering Laboratories, Inc.|Secure electric power delivery system protection during cyber threats|
    US11050234B2|2019-08-21|2021-06-29|Schweitzer Engineering Laboratories, Inc.|Integration of primary protection relays for electric power delivery systems|
    US11119128B2|2019-10-10|2021-09-14|Schweitzer Engineering Laboratories, Inc.|Loopback testing of electric power protection systems|
    US11079436B2|2019-10-12|2021-08-03|Schweitzer Engineering Laboratories, Inc.|Multiple merging unit testing system|
    US11114892B2|2019-10-12|2021-09-07|Schweitzer Engineering Laboratories, Inc.|Electric power system transducer failure monitor and measurement recovery|
    US11125821B2|2019-10-12|2021-09-21|Schweitzer Engineering Laboratories, Inc.|Testing device for protective relays in electric power delivery systems|
    US11258249B2|2019-10-12|2022-02-22|Schweitzer Engineering Laboratories, Inc.|Primary and system protection for an electric power delivery system|
    US11165238B2|2019-10-13|2021-11-02|Schweitzer Engineering Laboratories, Inc.|Electrical arc event detection in an electric power system|
    US10951057B1|2019-10-13|2021-03-16|Schweitzer Engineering Laboratories, Inc.|Reliable power module for improved substation device availability|
    US11112466B2|2019-10-13|2021-09-07|Schweitzer Engineering Laboratories, Inc.|Equipment failure detection in an electric power system|
    US11121536B2|2019-10-13|2021-09-14|Schweitzer Engineering Laboratories, Inc.|Digital input electric power system panel meter|
    US10896658B1|2020-04-02|2021-01-19|Schweitzer Engineering Laboratories, Inc.|Virtual display|
    US11115311B1|2020-05-18|2021-09-07|Schweitzer Engineering Laboratories, Inc.|Data tunneling for testing equipment in electric power system|
    US11056082B1|2020-09-29|2021-07-06|Schweitzer Engineering Laboratories, Inc.|Waterfall display for high-speed streaming measurements|
    法律状态:
    2015-06-30| B03A| Publication of a patent application or of a certificate of addition of invention [chapter 3.1 patent gazette]|
    2018-12-04| B06F| Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]|
    2019-12-10| B06U| Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette]|
    2020-06-02| B09A| Decision: intention to grant [chapter 9.1 patent gazette]|
    2020-10-20| B16A| Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]|Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 09/05/2013, OBSERVADAS AS CONDICOES LEGAIS. |
    优先权:
    申请号 | 申请日 | 专利标题
    EP12003838.5|2012-05-15|
    EP12003838.5A|EP2664933B1|2012-05-15|2012-05-15|Test device, test system and method for testing an energy test piece|
    [返回顶部]